TU Delft Optical Hydrogen Sensing & Thin Film Energy Materials

Today we presented our neutron reflectometry and diffraction beamline at the Materialen NL conference (‘Materials NL’) in Arnhem. These experimental techniques can be used to characterise materials. Diffraction to unreval the crystal structure of materials at the nm range, and neutron reflectometry to study the thicknesses, composition and roughness of thin layered films on the 2-200 nm scale. Amy Navarathna and Michel Thijs illustrated the potential of these experimental techniques using a poster and scaled models of the beamlines. We thank all enthusiast visitors of our booth fro there curiosity in our work and the possibility to use our set-ups.